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NALDC Record Details:

Evaluation of common bean elite lines developed in Brazil for angular leaf spot resistance.

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Author(s):
Melo, C.L.P. , Carneiro, J.E.S. , Ragagnin, V.A. , Cruz, L.C. , Moreira, M.A. , Barros, E.G. de
Subject(s):
Phaseolus vulgaris , beans , fungal diseases of plants , Phaeoisariopsis griseola , plant pathogenic fungi , pathogenicity , disease resistance , plant breeding , cultivars , genetic variation , pathotypes , virulence , progeny testing , Brazil
Format:
p. 231-232.
Coverage:
Brazil
Language:
English
Year:
2004
Collection:
Reports of Bean Improvement Cooperative and National Dry Bean Council Research Conference
Series:
Annual report.
Rights:
This item is authored by federal employees as part of their official duties and are therefore non-copyrightable and/or published by the federal government and now in the public domain.