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NALDC Record Details:

Impact of angular leaf spot on grain yield of common bean lines.

File:
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Author(s):
Ramalho, M.A.P. , Abreu, A. de F.B. , Santos, J.B. dos
Subject(s):
Phaseolus vulgaris , green beans , fungal diseases of plants , Phaeoisariopsis griseola , plant pathogenic fungi , pathogenicity , signs and symptoms (plants) , disease resistance , plant breeding , progeny testing , cultivars , genetic variation , crop production , crop yield , Brazil
Format:
p. 97-98.
Coverage:
Brazil
Language:
English
Year:
2007
Collection:
Reports of Bean Improvement Cooperative and National Dry Bean Council Research Conference
Series:
Annual report.
Rights:
This item is authored by federal employees as part of their official duties and are therefore non-copyrightable and/or published by the federal government and now in the public domain.